Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector

Leihong Zhang; Dong Liang; Bei Li; Yi Kang; Zilan Pan; Dawei Zhang; Xiuhua Ma

doi:10.1364/prj.4.000115

Journals >Photonics Research >Volume 4 >Issue 3 >Page 0115 > Article

Photonics Research
Vol. 4, Issue 3, 0115 (2016)

Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector

Leihong Zhang¹, Dong Liang¹, Bei Li¹, Yi Kang¹, Zilan Pan¹, Dawei Zhang^2、*, and Xiuhua Ma³

Author Affiliations

¹College of Communication and Art Design, University of Shanghai for Science and Technology, Shanghai 200093, China

²School of Optical Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China

³Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai 201800, China

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DOI: 10.1364/prj.4.000115 Cite this Article Set citation alerts

Leihong Zhang, Dong Liang, Bei Li, Yi Kang, Zilan Pan, Dawei Zhang, Xiuhua Ma. Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector[J]. Photonics Research, 2016, 4(3): 0115 Copy Citation Text

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