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    Journals >Infrared and Laser Engineering >Volume 33 >Issue 4 >Page 343 > Article
    • Infrared and Laser Engineering
    • Vol. 33, Issue 4, 343 (2004)
    Analysis and processing of CCD noise
    [in Chinese]*, [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Analysis and processing of CCD noise[J]. Infrared and Laser Engineering, 2004, 33(4): 343 Copy Citation Text show less
    References

    [3] Kriss Michael,Parulski Ken, David Lewis. Critical technologies for still imaging systems[A]. SPIE[C]. 1989,1082. 157-183.

    [5] Jim Janesick,Tom Ellion. Sandbox CCDs[A]. SPIE[C]. 1995,2415.2-41.

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    [in Chinese], [in Chinese], [in Chinese]. Analysis and processing of CCD noise[J]. Infrared and Laser Engineering, 2004, 33(4): 343
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