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    Journals >Microelectronics >Volume 53 >Issue 5 >Page 910 > Article
    • Microelectronics
    • Vol. 53, Issue 5, 910 (2023)
    Investigation of the Effect of Conduction Mechanism on Electrothermal Characteristics in JLNT-FET and IMNT-FET
    LIU Xianting1, LIU Weijing1, and LI Qinghua2
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  • 2[in Chinese]
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    DOI: 10.13911/j.cnki.1004-3365.230044 Cite this Article
    LIU Xianting, LIU Weijing, LI Qinghua. Investigation of the Effect of Conduction Mechanism on Electrothermal Characteristics in JLNT-FET and IMNT-FET[J]. Microelectronics, 2023, 53(5): 910 Copy Citation Text show less
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    LIU Xianting, LIU Weijing, LI Qinghua. Investigation of the Effect of Conduction Mechanism on Electrothermal Characteristics in JLNT-FET and IMNT-FET[J]. Microelectronics, 2023, 53(5): 910
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