Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 13 >Page 131206 > Article
    • Laser & Optoelectronics Progress
    • Vol. 57, Issue 13, 131206 (2020)
    Fast and Precise Acquisition of GPS Signal Optimized by Improved Orthogonal Search
    Jing Sun1、* and Wei Zhang1、2
    Author Affiliations
  • 1Information Management College, Liaoning University of International Business and Economics, Dalian, Liaoning 116052 China
  • 2Software College, Xi'an Jiaotong University, Xi'an, Shaanxi 710061, China
    • show less
    DOI: 10.3788/LOP57.131206 Cite this Article Set citation alerts
    Jing Sun, Wei Zhang. Fast and Precise Acquisition of GPS Signal Optimized by Improved Orthogonal Search[J]. Laser & Optoelectronics Progress, 2020, 57(13): 131206 Copy Citation Text show less
    Cited By
    Article index updated: May. 23, 2024
    Citation counts are provided from Researching.
    The article is cited by 1 article(s) from Researching.
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (4)
    Equations (0)
    References (16)
    Cited By (1)
    Get Citation
    Copy Citation Text
    Jing Sun, Wei Zhang. Fast and Precise Acquisition of GPS Signal Optimized by Improved Orthogonal Search[J]. Laser & Optoelectronics Progress, 2020, 57(13): 131206
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology