• Chinese Journal of Quantum Electronics
  • Vol. 22, Issue 3, 344 (2005)
[in Chinese]1、2、*, [in Chinese]1, [in Chinese]3, and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Existence of the best resolution of near-field optical microscope for dielectric spherical nanometric particles[J]. Chinese Journal of Quantum Electronics, 2005, 22(3): 344 Copy Citation Text show less
    References

    [2] Bozhevolnyi S, Berntsen S, Bozhenolnaya E. Extension of the macroscopic model for reflection near-field microscopy: regularization and image formation [J]. J. Opt. Soc. Am., 1994, B11: 6092.

    [3] Berntsen S, Bozhenolnaya E, Bozhevolnyi S. Macroscopic self-consistent model for external-reflection near-field microscopy [J]. J. Opt. Soc. Am., 1993, A10(5): 878.

    [4] Paule E, Reineker P. Near-field optical microscopy: a numerical study of resolution and contrast [J]. Luminescence., 1998, 76-77: 299.

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Existence of the best resolution of near-field optical microscope for dielectric spherical nanometric particles[J]. Chinese Journal of Quantum Electronics, 2005, 22(3): 344
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