[1] YU X, WEI Z, YU G, el at. Depth-image-based surface measurement sensor[J]. SPIE, 2001,4275: 94-98.
[4] YU X, CHEN D, WU L, el at. Structured-light based section outline sensor[J]. SPIE, 1999, 3835: 210-214.
[1] YU X, WEI Z, YU G, el at. Depth-image-based surface measurement sensor[J]. SPIE, 2001,4275: 94-98.
[4] YU X, CHEN D, WU L, el at. Structured-light based section outline sensor[J]. SPIE, 1999, 3835: 210-214.
Set citation alerts for the article
Please enter your email address