High resolution imaging based on photo-emission electron microscopy excited by deep ultraviolet laser

Hao-Chang Lü; Yun-Chi Zhao; Guang Yang; Bo-Wen Dong; Jie Qi; Jing-Yan Zhang; Zhao-Zhao Zhu; Yang Sun; Guang-Hua Yu; Yong Jiang; Hong-Xiang Wei; Jing Wang; Jun Lu; Zhi-Hong Wang; Jian-Wang Cai; Bao-Gen Shen; Feng Yang; Shen-Jin Zhang; Shou-Guo Wang

doi:10.7498/aps.69.20200083

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