Fig. 1. Schematic drawings of the DUV laser optical system with (a) circular and (b) linear polarizations^[69].

Fig. 2. Optical system of the DUV-PEEM system.

Fig. 3. A schematic layout of the DUV laser-based LEEM/PEEM system^[69].

Fig. 4. Schematic setup and photo of MBE-PEEM combined system.

Fig. 5. (a) PEEM image of multilayer graphene on Ru (0001) taken with Hg arc lamp; (b) spatial resolution calculated from obtained PEEM image^[71].

Fig. 6. Optical system of LEEM (E-Gun).

Fig. 7. (a) Dark field image and (b) LEED pattern of a (2 × 1) reconstructed Si (001) surface; (c) spatial resolution calculated from obtained LEEM image^[71].

Fig. 8. (a) DUV-PEEM image of PbO islands on Ru(0001); (b) spatial resolution calculated from obtained PEEM image^[71].

Fig. 9. (a) Schematic drawing of energy filter in PEEM system; (b) DUV-photo emission spectrum obtained from island-shaped PbO grown on Ru (0001) in dispersion mode; (c) normalized line profile with the calculated spatial resolution from selected area marked in panel (b).

Fig. 10. (a) Schematic structure and out-of-plane hysteresis loop of MgO (001) sub. /Cr (5 nm)/Pt (10 nm)/FePt (20 nm) films; (b) LEEM image (E_p = 8.6 eV) and LEED (E_p = 16.3 eV) pattern (inset) of FePt film; (c) magnetic domain (contrast enhanced) of the area marked by a red dashed rectangle in (b) taken with circularly polarized DUV laser; (d) magnetic domain image of the FePt films with the same structure obtained by magnetic force microscopy; (e) normalized line profile with the estimated spatial resolution from selected area marked in inset^[69].

Fig. 11. (a) Schematic drawing of a Pt seed layer with Cr step. (b) UV PEEM image of Pt seed layer consisting of two orientations. LEEM and LEED patterns of the selected areas marked by blue rectangles in panel (b): (c) dark area A, (d) light area B and (e) boundary area C. (f) DUV-PEEM image of the selected area marked by a red dashed rectangle in panel (b). (g) Linear dichroism image of the same area as panel (f)^[69].

Fig. 12. (a) UV-PEEM image of FePt film deposited on Pt seed layer with two orientations. LEED patterns of selected areas marked by blue rectangles in panel (a): (b) light area I and (c) dark area II. (d) DUV-PEEM image of the selected area marked by a red dashed rectangle in panel (a) taken with linearly polarized laser^[69].

Fig. 13. DUV-PEEM images taken with (a) left-circularly polarized and (b) right-circularly polarized light; (c) MCD image of FePt film; (d), (e) DUV-PEEM images taken with linearly-polarized laser (polarization shown by red arrow); (f) MLD image of FePt film; (g) polarization dependent MLD asymmetry for the selected area^[69].