A method for ray tracing and wavefront reconstruction is presented based on the structured light imaging. The phase information is carried in the fringes of structured light. The phase changes in the imaging process can be tested accurately by the phase-shifting technique and then used for ray tracing to get the spot diagram. The wavefront can be reconstructed because of the light traveling in direction normal to wavefront. A liquid crystal display (LCD) is illuminated behind a point light source, which displays the sine intensity-modulated patterns. The standard fringe beam is deformed when it travels through the tested lens. A CCD camera detects the deformed fringes and evaluation of the tested lens is done by the fringe analysis. The use of a computer display generation leads the flexible adjustment of period and direction of the patterns and accurate phase shift. The experiment confirms the feasibility of this method.