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Journals >Chinese Optics Letters >Volume 16 >Issue 11 >Page 111801 > Article

Chinese Optics Letters
Vol. 16, Issue 11, 111801 (2018)

Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging

Suhui Deng^1、2, Yiping Xiao¹, Jie Hu¹, Jianfang Chen³, Yuhao Wang¹, and Mingping Liu^1、*

Author Affiliations

¹School of Information Engineering, Nanchang University, Nanchang 330031, China

²Division of Physical Biology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China

³Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

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DOI: 10.3788/COL201816.111801 Cite this Article Set citation alerts

Suhui Deng, Yiping Xiao, Jie Hu, Jianfang Chen, Yuhao Wang, Mingping Liu. Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging[J]. Chinese Optics Letters, 2018, 16(11): 111801 Copy Citation Text

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References

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Data from CrossRef

[1] Suhui Deng, Peng Wang, Yulong Zhang, Huilin Zhou, Jianzhong Yang, Mingping Liu. Subtraction method via phase mask enables contrast enhancement in scanned Bessel light-sheet microscopy. Journal of the Optical Society of America A, 37, 84(2020).

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Suhui Deng, Yiping Xiao, Jie Hu, Jianfang Chen, Yuhao Wang, Mingping Liu. Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging[J]. Chinese Optics Letters, 2018, 16(11): 111801

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