Author Affiliations
School of Automation, Harbin University of Science and Technology, Harbin, Heilongjiang 150080, Chinashow less
Fig. 1. Tracing analysis of stray light effect in photometric measurement system. (a) Optical ray in ideal photometric measurement system; (b) optical ray in general photometric measurement system
Fig. 2. Varying curves of PST values under different conditions. (a) PST value as a function of off-axis angle; (b) PST value as a function of irradiance
Fig. 3. Principle of three-dimensional ray tracing analysis for photometric measurement system
Fig. 4. RBF network model for error correction of photometric measurement
Fig. 5. Improved error correction model for RBF network
Fig. 6. Comparison of RBF training processes before and after improvement
Fig. 7. Aperture structure of inner wall of optical darkroom
Fig. 8. Simulation model of distributed photometric measurement platform. (a) Infinite space; (b) general photometric measurement system; (c) photometric measurement system with triple aperture denoising structure
Fig. 9. Comparison of theoretical and measured values of luminous intensity
Fig. 10. Analysis charts of correction results of RBF network. (a) Outputs of photometric data before and after correction; (b) distributions of errors before and after correction
Model object | Model parameter |
---|
Darkroom length /m | 10 | Darkroom width /m | 4 | Darkroom height /m | 3 | Darkroom material | Acrylic board | Surface material | Matte black paint | Absorption rate | 0.85 |
|
Table 1. Basic information of light source measurement environment