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    Journals >Opto-Electronic Engineering >Volume 32 >Issue 11 >Page 59 > Article
    • Opto-Electronic Engineering
    • Vol. 32, Issue 11, 59 (2005)
    Higher-precision FTP based on digital light projecting
    [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Higher-precision FTP based on digital light projecting[J]. Opto-Electronic Engineering, 2005, 32(11): 59 Copy Citation Text show less
    References

    [1] Mitsuo Takeda,Kazuhiro Mutoh. Fourier transform profilometry for the automatic measurement of 3-D object shapes[J]. Appl.Opt,1983,22(24):3977-3982.

    [2] SU Xian-yu,CHEN Wen-jing. Fourier transform profilometry: a review[J]. Optics&lasers in Engineering,2001,35(5):263-284.

    [3] CHEN Wen-jing,SU Xian-yu,CAO Yi-ping,et al. Improving Fourier transform profilometry based on bicolor fringe pattern[J].Opt.Eng,2004,43(1):192-198.

    [4] YI Liang,HUANG Shang-lian. Modified Fourier Transform Profilometry for the Measurement of 3-D Steep Shapes[J]. Optics&Lasers in Engineering,1997,27(5):493-505.

    [6] Rafael C. Gonzalez,Richard E. Woods. Digital Image ProcessingSecond Edition[M]. Beijing:Publishing House of Electronics Industry,2002.63-66.

    [7] GUO Hong-wei,HE Hai-tao,CHEN Ming-yi. Gamma correction for digital fringe projection profilometry[J]. Appl.Opt,2004,43(14):2906-2914.

    [8] FARID Hany. Blind Inverse Gamma Correction[J]. IEEE Trans. Image Process,2001,10(10):1428-1433.

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    [in Chinese], [in Chinese], [in Chinese]. Higher-precision FTP based on digital light projecting[J]. Opto-Electronic Engineering, 2005, 32(11): 59
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