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    Journals >Opto-Electronic Engineering >Volume 44 >Issue 11 >Page 1124 > Article
    • Opto-Electronic Engineering
    • Vol. 44, Issue 11, 1124 (2017)
    Analysis on stitching overlap pixel threshold of one-orbit multi-strip agile remote sensing imaging
    Yue Xu, Huajun Feng, Zhihai Xu, Qi Li, and Yueting Chen
    Author Affiliations
  • State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, China
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    DOI: Cite this Article
    Yue Xu, Huajun Feng, Zhihai Xu, Qi Li, Yueting Chen. Analysis on stitching overlap pixel threshold of one-orbit multi-strip agile remote sensing imaging[J]. Opto-Electronic Engineering, 2017, 44(11): 1124 Copy Citation Text show less
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    Yue Xu, Huajun Feng, Zhihai Xu, Qi Li, Yueting Chen. Analysis on stitching overlap pixel threshold of one-orbit multi-strip agile remote sensing imaging[J]. Opto-Electronic Engineering, 2017, 44(11): 1124
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