Characteristics of Step Surface Shape Error in Snapshot Interference Imaging Spectrometer

Jinguang Lü; Jingqiu Liang; Weibiao Wang; Yuxin Qin; Jin Tao

doi:10.3788/AOS202242.0930001

[1] Wolfe W L. Introduction to imaging spectrometers[M]. Washington: SPIE(1997).

[2] Hagen N A, Kudenov M W. Review of snapshot spectral imaging technologies[J]. Optical Engineering, 52, 090901(2013).

[3] Hirai A, Inoue T, Itoh K et al. Application of measurement multiple-image Fourier of fast phenomena transform spectral imaging to measurement of fast phenomena[J]. Optical Review, 1, 205-207(1994).

[4] Kudenov M W, Dereniak E L. Compact real-time birefringent imaging spectrometer[J]. Optics Express, 20, 17973-17986(2012).

[5] Kudenov M W, Banerjee B, Chan V C et al. Compact snapshot birefringent imaging Fourier transform spectrometer for remote sensing and endoscopy[J]. Proceedings of SPIE, 8542, 854224(2012).

[6] Kudenov M W. Jungwirth M E L, Dereniak E L, et al. White-light Sagnac interferometer for snapshot multispectral imaging[J]. Applied Optics, 49, 4067-4076(2010).

[7] Liang J Q, Liang Z Z, Lü J G et al. Micro spatial modulation Fourier transform infrared spectrometer[J]. Chinese Optics, 8, 277-298(2015).

[8] Lü J G, Zhao B X, Liang J Q et al. Modeling and experiment of image field modulated Fourier transform imaging spectrometer[J]. Acta Optica Sinica, 40, 1811002(2020).

[9] Lü J G, Liang J Q, Wang W B et al. Modeling and analysis of miniature snapshot Fourier-transform imaging spectrometer[J]. Acta Optica Sinica, 40, 0230001(2020).

[10] Lü J G, Liang J Q, Wang W B et al. Monte Carlo analysis of array non-uniformity in snapshot Fourier transform imaging spectrometer[J]. Acta Optica Sinica, 41, 2430001(2021).

[11] Feng M C, Liu W Q, Xu L et al. Analysis of the mirror surface errors in a Michelson interferometer[J]. Acta Optica Sinica, 35, 0423002(2015).

[12] Bai J L, Jiang Y G, Wang L S et al. Study on the design and preparation technology of ultra-low profile wideband high reflection thin films[J]. Infrared and Laser Engineering, 50, 20200413(2021).

[13] Yuan H, Bai C X, Xu Y X et al. Fast and high precision image registration algorithm based on Fourier-Mellin transform[J]. Laser & Optoelectronics Progress, 56, 083001(2019).

[14] Wyant J C, Creath K[M]. Basic wavefront aberration theory for optical metrology, 9-11(1992).