• Opto-Electronic Engineering
  • Vol. 39, Issue 12, 77 (2012)
LI Wei1、2、3、*, SHI Ze-lin1、2, and YIN Jian4
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2012.12.013 Cite this Article
    LI Wei, SHI Ze-lin, YIN Jian. Detecting Fully Affine Invariant Features in Affine Gaussian Scale-space[J]. Opto-Electronic Engineering, 2012, 39(12): 77 Copy Citation Text show less
    References

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    LI Wei, SHI Ze-lin, YIN Jian. Detecting Fully Affine Invariant Features in Affine Gaussian Scale-space[J]. Opto-Electronic Engineering, 2012, 39(12): 77
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