A Data Driven Method for Screening of Electronic Components

XIONG Suqin; ZHANG Baoliang; LI Yang; ZHANG Penghe

doi:10.13911/j.cnki.1004-3365.210096

Journals >Microelectronics >Volume 51 >Issue 6 >Page 933 > Article

Microelectronics
Vol. 51, Issue 6, 933 (2021)

A Data Driven Method for Screening of Electronic Components

XIONG Suqin, ZHANG Baoliang, LI Yang, and ZHANG Penghe

Author Affiliations

[in Chinese]

show less

DOI: 10.13911/j.cnki.1004-3365.210096 Cite this Article

XIONG Suqin, ZHANG Baoliang, LI Yang, ZHANG Penghe. A Data Driven Method for Screening of Electronic Components[J]. Microelectronics, 2021, 51(6): 933 Copy Citation Text

show less

References

[1] LIU J S, LI C, LI S T, et al. Predicting the smart meters life cycle based on the analysis of correlation coefficient ［J］. Appl Mechan Mater, 2013, 313: 629-633.

[2] ZHANG P H. Study of electric parameter test methods and failure mechanism for optical coupler ［C］ // Elec Commun Engineer(CECE2017). Sanya, China. 2017: 29-34.

[3] YIP S C, WONG K S, HEW W P, et al. Detection of energy theft and detective smart meters in smart grids using linear regression ［J］. Int J Elec Power Energy Syst, 2017, 44(5): 35-42.

XIONG Suqin, ZHANG Baoliang, LI Yang, ZHANG Penghe. A Data Driven Method for Screening of Electronic Components[J]. Microelectronics, 2021, 51(6): 933

Download Citation

Tools

Save the article for my favorites

Paper Information