• Laser & Optoelectronics Progress
  • Vol. 54, Issue 6, 61205 (2017)
Wei Fenglong*, Tian Wei, and Peng Shijun
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/lop54.061205 Cite this Article Set citation alerts
    Wei Fenglong, Tian Wei, Peng Shijun. Precision Design and Analysis of Large Curvature Radius Measurement System[J]. Laser & Optoelectronics Progress, 2017, 54(6): 61205 Copy Citation Text show less
    References

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    [9] Mao Jie, Hou Xi, Wu Fan. Position error analysis in radius interferometric measurements[J]. Acta Photonica Sinica, 2015, 44(7): 0712003.

    [10] Peng Shijun, Miao Erlong. Sub-micron precision measurement of radius of curvature and uncertainties analysis[J]. Acta Optica Sinica, 2014, 34(5): 0512001.

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    [12] Miao Erlong, Gu Yongqiang. Temperature influence on Fizeau interferometer repeatability[J]. Acta Optica Sinica, 2011, 31(12): 1212008.

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    Wei Fenglong, Tian Wei, Peng Shijun. Precision Design and Analysis of Large Curvature Radius Measurement System[J]. Laser & Optoelectronics Progress, 2017, 54(6): 61205
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