[1] CHEN Lan，MO Dang. An overview and prospect on modern spectroscopic ellipsometry [J]. Chinese Journal Spectroscopy Laboratory，1999，16(1)：19-23.

[2] Azzam R M A. Division-of amplitude Photopolarimeter(DOAP) for the simultaneous measurement of all four Stokes parameters of light [J]. OPTICA ACTA(S0030-3909)，1982，29(5)：685-689.

[3] CHENG Min-xi，HE Zhen-jiang，HUANG Zuo-hua. Polarimeter System of Stokes Parameters Based on Division-of-Amplitude [J]. Opto-Electronic Engineering，2008，35(5)：93-97.

[4] Max Born，Emil Wolf. Principles of Optics：7th(expend)edition [M]. UK：Cambridge University Press，1999：24-33.

[5] Azzam R M A. Arrangement of four photo-detectors for measuring the states of polarization of light [J]. Opt. Let. (S0146-9592)，1985，10(7)：309-311.

[6] JIN Guo-fan，LI Jing-zhen. Laser Metrology：1st edition [M]. Beijing：Science Press，1998：242-244.

[7] LIAO Yan-biao. Polarization of Optics [M]. Beijing：Science Press，2003：52-56，243-244

[8] YANG Zhi-chang，WANG Qian-zhi，QIU Liu-zhen. Physical Optics Experiment [M]. Shanghai：Science and Technology Press of Shanghai，1986：227-252.

[9] WU Si-cheng，WANG Zu-quan. Modern Physics Experiment [M]. Beijing：Higher Education Press，2006：155-165.

[10] LIN Mu-xin. Modern Physics Experiment [M]. Beijing：Science Press，1999：133-139.

[11] HUANG Zuo-hua，HE Zhen-jiang，YANG Guan-ling，et al. The multifunctional ellipsometer [J]. Optical Technique，2001，27(5)：432-434.

[12] HE Zhen-jiang，YANG Guan-ling，HUANG Zuo-hua，et al. Design of automatic ellipsometer for nanometer film[J]. Mechanical & Electrical Engineering Technology，2002，31(6)：49-50.

[13] HUANG Zuo-hua，WU Xue-zhong，HE Zhen-jiang，et al. Design of a software for the ellipsometric data processing [J]. College Physics，2004，23(9)：41-45.

[14] DU Xi-liang，DAI Jing-min，XU Zhong-hui. High-speed potopolarimeter based on a linear neural network [J]. Optics and Precision Engineering，2006，14(5)：781-785.

[15] LI Gang，SUN Lian-chun，YU Zhao-bo. Polarization effects in optical thin films [J]. Optics and Precision Engineering，2003，11(6)：647-651.

[16] Azzam R M A，Bashara N M. Ellipsometry and Polarized Light [M]. New York：North-Holland Publishing Company，1977：283-292.

[17] Roy M Matchko，Grant R Gerhart. Polarization measurements using a commercial off-the-shelf digital camera [J]. Optical Engineering(S0091-3286)，2005，44(2)：023604-1-023604-10

[18] Marenori Kawamura，Yoshiaki Goto，Susumu Sato. Tow-dimensional measurements of cell parameter distributions in reflective liquid crystal displays by using multiple wavelengths Stokes parameters [J]. Journal of Applied Physics(S0021-8979)，2004，95(8)：4371-4375.

[19] Jellison G E. Spectroscopic ellipsometry data analysis: measured versus calculated quantities [J]. Thin Solid Films(S0040-6090)，1998，313/314：33-39.

[20] Han D，Kin Y S，Marilyn E. Norz. Stokes parameters as a Minkowskian four-vector [J]. PHYSICAL REVIEW E(S1539-3755)，1997，56(5)：6065-6076.

[21] QIN Zhao-yu，CHENG Zhao-gu. High speed and Real time Measurement of Stokes Parameters [J]. ACTA OPTICA SINICA，2007，27(4)：659-662