• Semiconductor Optoelectronics
  • Vol. 41, Issue 5, 681 (2020)
SHU Mingyang*, ZHOU Wen, and CHEN Donghao
Author Affiliations
  • [in Chinese]
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    DOI: 10.16818/j.issn1001-5868.2020.05.015 Cite this Article
    SHU Mingyang, ZHOU Wen, CHEN Donghao. Analysis and Improvement of the Graphic Distortion in Mask Copying Process[J]. Semiconductor Optoelectronics, 2020, 41(5): 681 Copy Citation Text show less
    References

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    [4] Jackson C, Kiefer R, Buck P. Print characterization of photomasks from next-generation deep-ultra-violet laser pattern generator[C]// Proc. Photomask and Next-Generation Lithography Mask Technology Ⅻ., 2005, 5853: 387-397.

    [5] Pang Linyong, Shamma N, Rissman P. Laser and E-beam mask-to-silicon with inverse lithography technology[C]// Proc. 25th Annual BACUS Symp. on Photomask Technol., 2005, 599221: 1-10.

    SHU Mingyang, ZHOU Wen, CHEN Donghao. Analysis and Improvement of the Graphic Distortion in Mask Copying Process[J]. Semiconductor Optoelectronics, 2020, 41(5): 681
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