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    Journals >Laser & Optoelectronics Progress >Volume 52 >Issue 7 >Page 71202 > Article
    • Laser & Optoelectronics Progress
    • Vol. 52, Issue 7, 71202 (2015)
    Study on Defect Detection of Optical Thin Film Using Optical Coherence Tomography
    Qin Yuwei1、2
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop52.071202 Cite this Article Set citation alerts
    Qin Yuwei. Study on Defect Detection of Optical Thin Film Using Optical Coherence Tomography[J]. Laser & Optoelectronics Progress, 2015, 52(7): 71202 Copy Citation Text show less
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    Qin Yuwei. Study on Defect Detection of Optical Thin Film Using Optical Coherence Tomography[J]. Laser & Optoelectronics Progress, 2015, 52(7): 71202
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