• Spectroscopy and Spectral Analysis
  • Vol. 30, Issue 3, 702 (2010)
MIAO Rui-xia*, ZHANG Yu-ming, TANG Xiao-yan, and ZHANG Yi-men
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  • [in Chinese]
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    DOI: Cite this Article
    MIAO Rui-xia, ZHANG Yu-ming, TANG Xiao-yan, ZHANG Yi-men. The Study of Nondestructive Defect Characterization of SiC by[J]. Spectroscopy and Spectral Analysis, 2010, 30(3): 702 Copy Citation Text show less
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    MIAO Rui-xia, ZHANG Yu-ming, TANG Xiao-yan, ZHANG Yi-men. The Study of Nondestructive Defect Characterization of SiC by[J]. Spectroscopy and Spectral Analysis, 2010, 30(3): 702
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