Author Affiliations
1Shaanxi University of Science & Technology, Xi'an 710021, China2Institute of High Energy Physics, Chinese Academy of Sciences, Dongguan 523000, Chinashow less
Fig. 1. Diagram of TDC chip structure
Fig. 2. Differential delay chain TDC
Fig. 3. Differential delay ring TDC
Fig. 4. Diagram of judgment unit combination(a) TDC first loop operation, (b) TDC second loop operation
Fig. 5. Sequence diagram of differential ring TDC
Fig. 6. Structure diagram of arbiter (a) Rise edge arbiter, (b) Falling edge arbiter
Fig. 7. Operating cycle of arbiter A
Fig. 8. Unexpected "01" conversion of arbiter B
Fig. 9. The sequence diagram shows that the register group filters out the false "01" at the falling edge (a) Fake "01" sequence diagram, (b) Sequence diagram after filtering fake "01"
Fig. 10. Sequence diagram of B1 (a) and B2 (b)
Fig. 11. Chip layout
Fig. 12. TDC chip diagram
Fig. 13. Calibration curve of delay ring
Fig. 14. Time accuracy of TDC
Fig. 15. Comparison of local time difference
Fig. 16. Comparison of overall time difference
Fig. 17. Counts of each TDC delay bin
Fig. 18. DNL test results
Fig. 19. INL test results
参考文献 Reference | 工艺 Technology | 面积 Area / μm2 | 分辨率 Resolution / ps | 时钟频率 Clock frequency / MHz | 功耗 Power loss / mW |
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[1] | 0.11 μm CMOS | 600×3 000 | 51.7 | 600 | <100 | [2] | SMIC 0.18 μm CMOS | 120×120 | 32 | 125 | | [3] | 0.13 μm GSMC | 300×40 | 70 | | 1.36 | [6] | 0.13 μm CMOS | | 57 | | | [17] | 0.18 μm CMOS | | 160 | | <8 | 本文 This paper | 0.18 μm SMIC | 1 350×1 350 | 17 | 250 | |
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Table 1. Comparison of TDC chips with different designs