Under the background of the short-wave infrared imaging spectroscopy application, we study a set of corrections of HgCdTe short-wave infrared focal plane arrays, including defective pixel correction and non-uniformity correction, and propose the correction principle of non-uniformity correction after defective pixel correction. Under standard radiation sources, the normal distribution of normal pixel output values is fitted, and the threshold of normal pixel output is set by the 3σ criterion to determine the number and the location of defective pixels in the detector. Then according to application requirements of short-wave infrared imaging spectroscopy, the spectral two-neighborhood mean replacement is applied to the defective pixels. After the defective pixel correction is completed, the non-uniformity correction of the detector is carried out by the two-point method with small calculation amount and strong real-time performance. The comprehensive correction results show that the defective pixels of the detector are effectively eliminated, the output values of defective pixels are well corrected, the effect of non-uniformity correction is obvious, and the image details are more abundant.