• Acta Photonica Sinica
  • Vol. 32, Issue 6, 742 (2003)
[in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese]. Shearing Electron-scattered Speckle Interference Phase-shift System Study for Deflection Reflecting Mirror Manner of Automatic Control[J]. Acta Photonica Sinica, 2003, 32(6): 742 Copy Citation Text show less
    References

    [1] Hung Y Y, Liang C Y.Image-shearing camera for direct measurement of surface strains.Appl Opt,1979,18(7):1046~1051

    [2] Hung Y Y. Shearography: A new optical method for strain measurement and nondestructive testing.Opt Eng, 1982,21(3):391~395

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    [6] Creath K.Phase-shifting speckle-pattern interferormetry.Appl Opt,1985,24(18):3053~3058

    [in Chinese]. Shearing Electron-scattered Speckle Interference Phase-shift System Study for Deflection Reflecting Mirror Manner of Automatic Control[J]. Acta Photonica Sinica, 2003, 32(6): 742
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