A spectroscopic method for determining thickness of quartz wave plate

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Chinese Optics Letters >Volume 4 >Issue 12 >Page 705 > Article

Chinese Optics Letters
Vol. 4, Issue 12, 705 (2006)

A spectroscopic method for determining thickness of quartz wave plate

[in Chinese]¹, [in Chinese]¹, [in Chinese]², [in Chinese]³, [in Chinese]¹, and [in Chinese]¹

Author Affiliations

¹State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800

²Remote Sensing Laboratory, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031

³College of Physics Science and Technology, China University of Petroleum, Qingdao 266555

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A spectroscopic method for determining thickness of quartz wave plate[J]. Chinese Optics Letters, 2006, 4(12): 705 Copy Citation Text

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References

[1] Y.-T. Jeng and Y.-L. Lo, Appl. Opt. 45, 1134 (2006).

[2] P. Zhao, F. Wu, D. Hao, R. Wang, and S. Ren, Acta Opt. Sin. (in Chinese) 26, 379 (2006).

[3] Y.-L. Lo, J.-F. Lin, and S.-Y. Lee, Appl. Opt. 43, 6248 (2004).

[4] M.-H. Chiu, C.-D. Chen, and D.-C. Su, J. Opt. Soc. Am. A 13, 1924 (1996).

[5] P. S. K. Lee, J. B. Pors, M. P. Exter, and J. P. Woerdman, Appl. Opt. 44, 866 (2005).

[6] F. Brehat, B. Wyncke, and A. M. Benoit, J. Phys. D 32, 227 (1999).

[7] M. J. M. deLepinary, J. Phys. 1, 23 (1892).

[8] A. E. Ennos and K. W. Opperman, Appl. Opt. 5, 170 (1966).

[9] V. G. Dmitriev, G. G. Gurzadyan, and D. N. Nikogosyan, in Handbook of Nonlinear Optical Crystals A. E. Siegman (ed.) (Springer-Verlag, Berlin, Heidelberg, 1997) p.284.

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[5] [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Spectrometer Method for Determining Thickness of Quartz Plate Along the Crystal Axis[J]. Acta Optica Sinica, 2007, 27(11): 2082

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A spectroscopic method for determining thickness of quartz wave plate[J]. Chinese Optics Letters, 2006, 4(12): 705

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