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    Journals >Electro-Optic Technology Application >Volume 26 >Issue 4 >Page 81 > Article
    • Electro-Optic Technology Application
    • Vol. 26, Issue 4, 81 (2011)
    Reliability Accelerated Testing(RAT)for Electronic Equipments
    ZHANG Qiu-ju1 and LIU Cheng-yu2
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    ZHANG Qiu-ju, LIU Cheng-yu. Reliability Accelerated Testing(RAT)for Electronic Equipments[J]. Electro-Optic Technology Application, 2011, 26(4): 81 Copy Citation Text show less
    References

    [4] GREGG K Hobbs. Accelerated Reliability Engineering HALT and HASS[M]. New York: JohnW iley& Sons Ltd，2000.

    [5] MIL-HDBK-338B，ELECTRONICRELIABILITYDE-SIGNHANDBOOKS[S]，1998.

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    ZHANG Qiu-ju, LIU Cheng-yu. Reliability Accelerated Testing(RAT)for Electronic Equipments[J]. Electro-Optic Technology Application, 2011, 26(4): 81
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