• Opto-Electronic Engineering
  • Vol. 34, Issue 3, 42 (2007)
[in Chinese]1、2、3, [in Chinese]4, [in Chinese]1, [in Chinese]3, and [in Chinese]1
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Photometric characteristic measurement of space target[J]. Opto-Electronic Engineering, 2007, 34(3): 42 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Photometric characteristic measurement of space target[J]. Opto-Electronic Engineering, 2007, 34(3): 42
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