• Chinese Optics Letters
  • Vol. 14, Issue 6, 062501 (2016)
Junqiang Shao1、2, Xueting Yuan1、2, Zelin Mu1、2, and Gang Ni1、2、*
Author Affiliations
  • 1Department of Optical Science and Engineering, Fudan University, Shanghai 200433, China
  • 2Shanghai Engineering Research Center for Ultra-Precision Optical Manufacturing, Fudan University, Shanghai 200433, China
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    DOI: 10.3788/COL201614.062501 Cite this Article Set citation alerts
    Junqiang Shao, Xueting Yuan, Zelin Mu, Gang Ni. Magnetic field effects in organic light-emitting diodes with Co electrode[J]. Chinese Optics Letters, 2016, 14(6): 062501 Copy Citation Text show less
    EL intensity-voltage and current-voltage characteristics of the devices with Co thickness of 4 nm at 50 K. The device structure is schematically shown in the left inset, and the results fitted according to the power law are shown in the right inset.
    Fig. 1. EL intensity-voltage and current-voltage characteristics of the devices with Co thickness of 4 nm at 50 K. The device structure is schematically shown in the left inset, and the results fitted according to the power law are shown in the right inset.
    (a) MEL and (b) MC response of the device with the Co thickness of 4 nm under the bias voltage of 25 V at 50 K is plotted. Red solid lines show the non-Lorentzian line shape.
    Fig. 2. (a) MEL and (b) MC response of the device with the Co thickness of 4 nm under the bias voltage of 25 V at 50 K is plotted. Red solid lines show the non-Lorentzian line shape.
    MEL and MC values as a function of bias voltage in the device under the applied field of 42 mT at 50 K.
    Fig. 3. MEL and MC values as a function of bias voltage in the device under the applied field of 42 mT at 50 K.
    Temperature dependence of MEL in the device with the Co thickness of 4 nm under 25 V.
    Fig. 4. Temperature dependence of MEL in the device with the Co thickness of 4 nm under 25 V.
    MEL and turn-on voltage as a function of Co thickness in the devices under the applied field of 42 mT at 50 K.
    Fig. 5. MEL and turn-on voltage as a function of Co thickness in the devices under the applied field of 42 mT at 50 K.
    Normalized hysteresis loops for the samples with different Co thicknesses.
    Fig. 6. Normalized hysteresis loops for the samples with different Co thicknesses.
    Junqiang Shao, Xueting Yuan, Zelin Mu, Gang Ni. Magnetic field effects in organic light-emitting diodes with Co electrode[J]. Chinese Optics Letters, 2016, 14(6): 062501
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