[1] Wu X X, Wang H J, Wei C et al. Surface defect detection based on scattering field distribution fitting approximation[J]. Laser & Optoelectronics Progress, 58, 1112003(2021).

[2] You K W, Zhang Y L, Zhang X J et al. Influence of relative position of optical component surface defects on near field beam quality[J]. Chinese Journal of Lasers, 42, 0308004(2015).

[3] Qian Y M, Gong M L, Yang Y H. 3D reconstruction of transparent objects with position-normal consistency[C], 4369-4377(2016).

[4] Huang Y Y, Yue H M, Fang Y Y et al. Structured-light modulation analysis technique for contamination and defect detection of specular surfaces and transparent objects[J]. Optics Express, 27, 37721-37735(2019).

[5] Yeung S K, Wu T P, Tang C K et al. Normal estimation of a transparent object using a video[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 37, 890-897(2015).

[6] Wu B J, Zhou Y, Qian Y M et al. Full 3D reconstruction of transparent objects[EB/OL]. https://arxiv.org/abs/1805.03482

[7] Lee H S, Shin S, Lee H et al. Determining the micro-optical element surfaces profiles using transmission deflectometry with liquids[J]. Current Applied Physics, 15, 302-306(2015).

[8] Han K, Wong K Y K, Liu M M. Dense reconstruction of transparent objects by altering incident light paths through refraction[J]. International Journal of Computer Vision, 126, 460-475(2018).

[9] Liu D, Wang S T, Cao P et al. Dark-field microscopic image stitching method for surface defects evaluation of large fine optics[J]. Optics Express, 21, 5974-5987(2013).

[10] Zhang H Y, Wang Z H, Fu H Y. Automatic scratch detector for optical surface[J]. Optics Express, 27, 20910-20927(2019).

[11] Zhang J H, Zhang Y, Shi Z G et al. Reflected light separation on transparent object surface based on normal vector estimation[J]. Acta Optica Sinica, 41, 1526001(2021).

[12] Wang W, Wang J, Huang Y Y et al. Surface defect detection in transparent objects using polarized transmission structured light[J]. Acta Optica Sinica, 41, 1812002(2021).

[13] Schneider V M, Mlejnek M, Gahagan K T. Fast detection of single-sided diffracted defects in display glass[J]. Measurement, 42, 638-644(2009).

[14] Sprenger D, Faber C, Seraphim M et al. UV-deflectometry: no parasitic reflections[EB/OL]. https://www.dgao-proceedings.de/abstract/abstract_only.php?id=1152

[15] Huang L, Asundi A K. Phase retrieval from reflective fringe patterns of double-sided transparent objects[J]. Measurement Science and Technology, 23, 085201(2012).

[16] Wang R Y, Li D H, Xu K Y et al. Study on eliminating the effect of parasitic reflection on deflectometry measurement of planar optical element surface figure[J]. Proceedings of SPIE, 10841, 1084119(2019).

[17] Tao S W, Yue H M, Chen H L et al. Elimination of parasitic reflections for objects with high transparency in phase measuring deflectometry[J]. Results in Physics, 15, 102734(2019).

[18] Ye J Q, Niu Z Q, Zhang X C et al. Simultaneous measurement of double surfaces of transparent lenses with phase measuring deflectometry[J]. Optics and Lasers in Engineering, 137, 106356(2021).

[19] Su L K, Su X Y, Li W S et al. Application of modulation measurement profilometry to objects with surface holes[J]. Applied Optics, 38, 1153-1158(1999).

[20] Greivenkamp J E[M]. Field guide to geometrical optics(2004).

[21] Shih Y C, Krishnan D, Durand F et al. Reflection removal using ghosting cues[C], 3193-3201(2015).

[22] Ranganathan A. The Levenberg-Marquardt algorithm[J]. Tutoral on LM algorithm, 11, 101-110(2004).

[23] Zhang Z. A flexible new technique for camera calibration[J]. IEEE Transactions on Pattern Analysis and Machine Intelligence, 22, 1330-1334(2000).