Height coordinates calibration based on temporal phase unwrapping

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 33 >Issue 1 >Page 103 > Article

Opto-Electronic Engineering
Vol. 33, Issue 1, 103 (2006)

Height coordinates calibration based on temporal phase unwrapping

[in Chinese]¹, [in Chinese]¹, and [in Chinese]²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese]. Height coordinates calibration based on temporal phase unwrapping[J]. Opto-Electronic Engineering, 2006, 33(1): 103 Copy Citation Text

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References

[1] SRINIVASAN V,LIU H C,HALIOUA M.Automated phase-measuring profilometry:A phase mapping approach[J].Appl.Opt,1985,24(2):185-188.

[2] ZHOU W.S,SU X.Y.A direct mapping algorithm for phase-measuring profilometry[J].J.Mod.Opt,1994,41(1):89-94.

[4] SU X.Y,SONG W.Z,CAO Y.P.Phase-height mapping and coordinate calibration simultaneously in phase-measuring profilometry[J].OpticalEngineering,2004,43(3):708-712.

[5] HUNTLEY J.M,SALDNER H.O.Temporal phase-unwrapping algorithm for automated interferogram analysis[J].Applied Optics,1993,32(17):3047-3052.

[7] HUNTLEY J.M,SALDNER H.O.Shape measurement by temporal phase unwrapping:comparison of unwrapping algorithms[J].Meas.Sci.Technol,1997,8(9):986-992.

[8] HUNTLEY J.M,SALDNER H.O.Error-reduction methods for shape measurement by temporal phase unwrapping[J].J.Opt.Soc.Am.A,1997,14(12):3188-3196.

[9] FITZGIBBON A W,PILU M,FISHER R B.Direct least-squares fitting of ellipses[J].IEEE Trans.Pattern Analysts and Machine Intelligence,1999,21(5):476-480.

[in Chinese], [in Chinese], [in Chinese]. Height coordinates calibration based on temporal phase unwrapping[J]. Opto-Electronic Engineering, 2006, 33(1): 103

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