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    Journals >Infrared and Laser Engineering >Volume 35 >Issue 5 >Page 513 > Article
    • Infrared and Laser Engineering
    • Vol. 35, Issue 5, 513 (2006)
    Test and analysis of optical film constants
    [in Chinese]*, [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Test and analysis of optical film constants[J]. Infrared and Laser Engineering, 2006, 35(5): 513 Copy Citation Text show less
    References

    [1] MACLEOD H A.Thin-film optical filters[M].3rd Edition.Institute of Physics Publishing Bristol and Philadelphia,2001:257-347.

    [2] MANIFACIER J C,GASIOT J,FILLARD J P.A simple method for the determination of the optical constants n,k and the thickness of a weakly absorbing thin film[J].J.Phys.E,1976,9(11):1002-1004.

    [3] SWANEPOEL R.Determination of the thickness and optical constants of amorphous silicon[J].J.Phys.E,1983,16:1214-1222.

    [4] HALL J F,FERGUSON Jr W F C.Optical properties of cadmium sulfide and zinc sulfide from 0.6 micron to 14 microns[J].J Opt Soc Am,1955,45(9):714-718.

    [5] LVěQUE G,VILLACHON-RENARD Y.Determination of optical constants of thin film from reflectance spectra[J].APPLIED OPTICS,1990,29(22),3207-3212.

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    [in Chinese], [in Chinese], [in Chinese]. Test and analysis of optical film constants[J]. Infrared and Laser Engineering, 2006, 35(5): 513
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