[1] A. H. Lettington, Q. H. Hong, J. MacDonald et al.. Measurement of the MTF and the MRTD for focal plane arrays［C］. SPIE, 1993, 1969: 217～224

[2] W. Wittenstein, J. C. Fontanells, A. R. Newbery et al.. The definition of the OTF and the measurement of aliasing for sampled imaging systems［J］. Opt. Acta, 1982, 29(1): 41～50

[3] S. K. Park, R. Schowengendt, S. A. Kaczynski. Modulation-transfer-function analysis for sampled image systems［J］. Appl. Opt., 1984, 23(15): 2572～2582

[4] D. H. Seib. Carrier diffusion degradation of modulation transfer function in charge-coupled imagers［J］. IEEE Trans. Electron Devices, 1974, 21(3): 210～217

[5] G. Eric, A. Stevens. Unified model of carrier diffusion and sampling aperture effects on MTF in solid-state image sensors［J］. IEEE Trans. Electron Devices, 1992, 39(11): 2621～2623

[6] W. Buchtemann. Modulation transfer function of extrinsic Si-detector arrays affected by optical crosstalk［J］. IEEE Trans. Electron Devices, 1980, 27(1): 189～193

[7] B. M. Lambert, J. M. Harbord. Experimental methods for measurement of the modulation transfer function (MTF) for time-delay-and-integrate (TDI) charge coupled device (CCD) image sensors［C］. SPIE, 2009, 7405: 74050M

[8] M. M. Coakley, G. D. Berthiaμme, E. J. Ringdahl et al.. Optical performance measurements of large IR focal plane arrays for GOES［C］. SPIE, 2000, 4135: 129～139

[9] A. Lengwenus, P. Erichsen. MTF measurement of infrared optical systems［C］. SPIE, 2009, 7481: 74810V

[10] Gong Faquan. Study on Optical Modulation Transfer Function of CCD and Its Measuring Method［D］.Changchun: Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, 2002

[11] Ma Weihong. Study of MTF Measurement Technique Based on Image Analysis［D］. Xi′an: Xi′an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, 2005

[12] Jiang Xiaoguo, Tan Zhao, Li Zeren et al.. The study on the factors affecting CCD modulated transfer function［J］. Acta Photonica Sinica, 2003, 32(7): 830～833

[13] Feng Zhiwei, Cheng Haobo, Song Qian et al.. Modulation transfer function measurement of electron multiplying CCD［J］. Acta Optica Sinica, 2008, 28(9): 1710～1716

[14] Zhang Xiaolin, Du Guohao, Deng Biao et al.. High precision measurement of modulation transfer function for X-ray CCD with knife-edge method［J］. Acta Optica Sinica, 2010, 30(6): 1680～1687

[15] Zhang Zhiheng. Study on MTF Measurement System and Technique of Infrared Focal Plane Arrays［D］.Nanjing: Nanjing Institute of Technology, 2004

[16] Chen Bing. Study on MTF Measurement Technology of Cooled HgCdTe Infrared Focal Plane Arrays［D］. Nanjing: Nanjing Institute of Technology, 2002

[17] Hao Qun, Sha Dingguo, Zheng Naimei. The calculation and analysis of knife-edge and slit scanning in OTF measuring equipment［J］. Optical Technique, 2001, 27(1): 41～43

[18] Huang Yuanshen, Ni Zhengji. Research of the concentric three-reflection optical system［J］. Optical Instruments, 2005, 27(2): 42～46

[19] Xu Zhonghua, Wang Jing, Zhao Longcheng et al.. An all-reflective optical system for the modulation transfer function measurement of near-infrared focal plane arrays［J］. Chinese J. Lasers, 2011, 38(s1): s116002