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    Journals >INFRARED >Volume 41 >Issue 11 >Page 22 > Article
    • INFRARED
    • Vol. 41, Issue 11, 22 (2020)
    Study on Thickness Uniformity of 4-inSilicon-based Cadmium Telluride
    Zhen LI*, Da GAO, Jing-xia SHI, and Cong WANG
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    DOI: 10.3969/j.issn.1672-8785.2020.11.004 Cite this Article
    LI Zhen, GAO Da, SHI Jing-xia, WANG Cong. Study on Thickness Uniformity of 4-inSilicon-based Cadmium Telluride[J]. INFRARED, 2020, 41(11): 22 Copy Citation Text show less
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    LI Zhen, GAO Da, SHI Jing-xia, WANG Cong. Study on Thickness Uniformity of 4-inSilicon-based Cadmium Telluride[J]. INFRARED, 2020, 41(11): 22
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