Investigation of single event effect in 28-nm system-on-chip with multi patterns

Wei-Tao Yang; Yong-Hong Li; Ya-Xin Guo; Hao-Yu Zhao; Yang Li; Pei Li; Chao-Hui He; Gang Guo; Jie Liu; Sheng-Sheng Yang; Heng An

doi:10.1088/1674-1056/ab99b8

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