Wei-Tao Yang, Yong-Hong Li, Ya-Xin Guo, Hao-Yu Zhao, Yang Li, Pei Li, Chao-Hui He, Gang Guo, Jie Liu, Sheng-Sheng Yang, Heng An. Investigation of single event effect in 28-nm system-on-chip with multi patterns[J]. Chinese Physics B, 2020, 29(10):
- Chinese Physics B
- Vol. 29, Issue 10, (2020)
Fig. 1. SEU cross sections in HI-13 irradiation.
Fig. 2. SEFI cross sections in the HI-13 irradiation.
Fig. 3. The detected upset cells in the HIRFL irradiation.
Fig. 4. The cross sections of the tests in HIRFL irradiation.
Fig. 5. The detected currents in the HIRFL irradiation, (a) the currents are higher than the normal case, (b) a part of the currents are less than the normal case.
Fig. 6. The Weibull fitting from the irradiation tests.
Fig. 7. SEFI cross section of different tests in HIRFL irradiation.
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Table 1. The used ions in the heavy ion irradiation.
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Table 2. The detected errors in the HI-13 irradiation.
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Table 3. The parameters of the tests in HIRFL irradiation.
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Table 4. The detected SEE in HIRFL irradiation.
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Table 5. The cross sections ratio between static and dynamic tests in HI-13 irradiation.
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Table 6. The Weibull function parameters for both fittings.
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Table 7. The predicted SoC orbit soft error rate.
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