• Acta Optica Sinica
  • Vol. 38, Issue 11, 1105002 (2018)
Haixia Cao1、2、*, Yingfei Zhao2, Miao He1、2, Weidong Wang2, and Chao Wang3
Author Affiliations
  • 1 Central Iron & Steel Research Institute, Beijing 100081, China;
  • 2 NCS Testing Technology Co., Ltd., Beijing 100094, China
  • 3 Institute of Space Electro Optical Technology, Changchun University of Science and Technology, Changchun, Jilin 130022, China
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    DOI: 10.3788/AOS201838.1105002 Cite this Article Set citation alerts
    Haixia Cao, Yingfei Zhao, Miao He, Weidong Wang, Chao Wang. Design of Small-Size High Resolution Echelle Grating Spectrometer with Divided Spectral Coverage[J]. Acta Optica Sinica, 2018, 38(11): 1105002 Copy Citation Text show less
    Schematic of conical diffraction of echelle grating
    Fig. 1. Schematic of conical diffraction of echelle grating
    Schematic of prism dispersion
    Fig. 2. Schematic of prism dispersion
    Schematic of beam passing through double-slit and collimating mirror
    Fig. 3. Schematic of beam passing through double-slit and collimating mirror
    Flow chart of structure parameters, usage parameters of prism, and double-slit interval design
    Fig. 4. Flow chart of structure parameters, usage parameters of prism, and double-slit interval design
    Schematic of optical path configuration. (a) 210-800 nm; (b) 165-230 nm
    Fig. 5. Schematic of optical path configuration. (a) 210-800 nm; (b) 165-230 nm
    Spot diagrams of simulated spectral lines for different reference wavelengths. (a) 799 nm; (b) 275.8 nm; (c) 226.8 nm; (d) 200 nm; (e) 185.85 nm; (f) 165 nm
    Fig. 6. Spot diagrams of simulated spectral lines for different reference wavelengths. (a) 799 nm; (b) 275.8 nm; (c) 226.8 nm; (d) 200 nm; (e) 185.85 nm; (f) 165 nm
    Simulated aberration curves for different reference wavelengths.(a) 799 nm; (b) 275.8 nm; (c) 226.8 nm; (d) 200 nm; (e) 185.85 nm; (f) 165 nm
    Fig. 7. Simulated aberration curves for different reference wavelengths.(a) 799 nm; (b) 275.8 nm; (c) 226.8 nm; (d) 200 nm; (e) 185.85 nm; (f) 165 nm
    (a) Simulated spectra at image plane of two-dimensional detector.(a) 210-800 nm; (b) 165-230 nm
    Fig. 8. (a) Simulated spectra at image plane of two-dimensional detector.(a) 210-800 nm; (b) 165-230 nm
    Spectral calibration. (a) 210-800 nm; (b) 165-230 nm; (c) 165-800 nm
    Fig. 9. Spectral calibration. (a) 210-800 nm; (b) 165-230 nm; (c) 165-800 nm
    ParameterValue
    Spectral range165-230 nm,210-800 nm
    CCD parameterPixel size:13 μm×13 μmEffective pixel number: 1024×2014
    Prism apex angle21.5°
    Echelle grating blazed angle46°
    Echelle grating groove density54.49 line·mm-1
    Echelle grating off-axis angle
    Distance between double-slit8.1 mm
    Focus length200 mm
    Table 1. Design parameters of spectrometer
    Haixia Cao, Yingfei Zhao, Miao He, Weidong Wang, Chao Wang. Design of Small-Size High Resolution Echelle Grating Spectrometer with Divided Spectral Coverage[J]. Acta Optica Sinica, 2018, 38(11): 1105002
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