• Acta Physica Sinica
  • Vol. 69, Issue 13, 136103-1 (2020)
Zhan-Gang Zhang1, Bing Ye2, Qing-Gang Ji2, Jin-Long Guo2, Kai Xi3, Zhi-Feng Lei1、*, Yun Huang1、*, Chao Peng1, Yu-Juan He1, Jie Liu2, and Guang-Hua Du2
Author Affiliations
  • 1Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China
  • 2Material Research Center, Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
  • 3Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China
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    DOI: 10.7498/aps.69.20201796 Cite this Article
    Zhan-Gang Zhang, Bing Ye, Qing-Gang Ji, Jin-Long Guo, Kai Xi, Zhi-Feng Lei, Yun Huang, Chao Peng, Yu-Juan He, Jie Liu, Guang-Hua Du. Mechanisms of alpha particle induced soft errors in nanoscale static random access memories[J]. Acta Physica Sinica, 2020, 69(13): 136103-1 Copy Citation Text show less
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    Zhan-Gang Zhang, Bing Ye, Qing-Gang Ji, Jin-Long Guo, Kai Xi, Zhi-Feng Lei, Yun Huang, Chao Peng, Yu-Juan He, Jie Liu, Guang-Hua Du. Mechanisms of alpha particle induced soft errors in nanoscale static random access memories[J]. Acta Physica Sinica, 2020, 69(13): 136103-1
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