Author Affiliations
1School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240, China2The Second System Design, The Second Research Academy, CASIC, Beijing 100854, Chinashow less
Fig. 1. Schematic of fringe projection system
Fig. 2. Schematic of bidirectional reflection on object surface
Fig. 3. Flowchart of the system
Fig. 4. Image stereo rectification
Fig. 5. BRDF parameter distribution of plane under custom parameters
Fig. 6. BRDF distribution fitting process. (a) BRDF distribution in highlight area; (b) BRDF high-order surface fitting distribution in highlight area; (c) fitting error distribution
Fig. 7. Image matching process. (a) Original projected image; (b) original image taken by camera; (c) image in real scene; (d) one-dimensional alignment image between camera and projector after matching and correction
Fig. 8. Comparison between BRDF and real light intensity. (a) Metal surface image under real scene; (b) comparison between BRDF distribution and real light intensity distribution
Fig. 9. Experience part
Fig. 10. System experiment. (a) Original image; (b)unmodulated fringe pattern; (c) unmodulated depth diagram; (d) unmodulated point clouds; (e)modulated fringe pattern; (f) modulated depth diagram; (g) modulated point clouds
Fig. 11. Accuracy verification experiment. (a) Step point clouds; (b) Plane fitting and distance between steps
Scheme | Total number of pixels | Number of valid pixels | Number of invalid pixels | Valid pixel percentage /% |
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Unmodulated | 159735 | 96199 | 63536 | 60.2 | Modulated | 159735 | 128801 | 30934 | 80.6 |
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Table 1. Completeness analysis of pixels in depth map
Parameter | Initialization | Fringe generation | Fringe projection | Phaseanalysis | Reconstruction | Modulation parametercalculation |
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Time /s | 8.96615 | 0.499453 | 9.16511 | 1.55931 | 1.13660 | 0.377363 | Proportion | 21.8 | 1.32 | 24.3 | 4.13 | 3.01 | 1 |
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Table 2. Calculation time of each stage of fringe projection
Plane | Distance between adjacent planes | RMS of point distribution |
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Refencedistance /mm | Unmodulatedscheme | Modulatedscheme | Refencevalue /mm | Measuredvalue byunmodulatedscheme /mm | Measuredvalue bymodulatedscheme /mm |
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Measureddistance /mm | Error /mm | Measureddistance /mm | Error /mm | Plane 1 | | | | | | 0.0128 | 0.0347 | 0.0372 | Plane 2 | 4.9960 | 4.9527 | 0.0433 | 5.0238 | 0.0278 | 0.0146 | 0.0768 | 0.0495 | Plane 3 | 4.9897 | 5.1795 | 0.1898 | 4.9975 | 0.0078 | 0.0135 | 0.1203 | 0.0590 | Plane 4 | 4.9857 | 5.2780 | 0.2923 | 4.9246 | 0.0611 | 0.0133 | 0.0478 | 0.0376 |
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Table 3. Accuracy verification experimental data