• Laser & Optoelectronics Progress
  • Vol. 60, Issue 24, 2422001 (2023)
Qingyue Wu1, Jiamin Liu1、*, Song Zhang1, Hao Jiang1, and Shiyuan Liu1、2、**
Author Affiliations
  • 1State Key Laboratory of Intelligent Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan 430074, Hubei, China
  • 2Hubei Optics Valley Laboratory, Wuhan 430074, Hubei, China
  • show less
    DOI: 10.3788/LOP231038 Cite this Article Set citation alerts
    Qingyue Wu, Jiamin Liu, Song Zhang, Hao Jiang, Shiyuan Liu. Lithography Hotspot Detection Based on Improved Yolov5s[J]. Laser & Optoelectronics Progress, 2023, 60(24): 2422001 Copy Citation Text show less
    References

    [1] Carre H, Doxtator R H, Duffy M C. Semiconductor manufacturing technology at IBM[J]. IBM Journal of Research and Development, 26, 528-531(1982).

    [2] Chen A, Foong Y M, Thaler T et al. Aerial image metrology for OPC modeling and mask qualification[J]. Proceedings of SPIE, 10446, 104460V(2017).

    [3] Mitra J, Yu P, Pan D Z. RADAR: RET-aware detailed routing using fast lithography simulations[C], 369-372(2005).

    [4] Cobb N B, Zakhor A, Miloslavsky E. Mathematical and CAD framework for proximity correction[J]. Proceedings of SPIE, 2726, 208-222(1996).

    [5] Yao H, Sinha S, Chiang C et al. Efficient process-hotspot detection using range pattern matching[C], 625-632(2007).

    [6] Yu Y T, Lin G H, Jiang I H R et al. Machine-learning-based hotspot detection using topological classification and critical feature extraction[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 34, 460-470(2015).

    [7] Gao J R, Yu B, Pan D Z. Accurate lithography hotspot detection based on PCA-SVM classifier with hierarchical data clustering[J]. Proceedings of SPIE, 9053, 90530E(2014).

    [8] Shin M, Lee J H. CNN based lithography hotspot detection[J]. International Journal of Fuzzy Logic and Intelligent Systems, 16, 208-215(2016).

    [9] Jiang Y Y, Yang F, Yu B et al. Efficient layout hotspot detection via binarized residual neural network ensemble[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 40, 1476-1488(2021).

    [10] Liao L F, Li S K, Wang X Z. Lithography hotspot detection method based on pre-trained VGG11 model[J]. Acta Optica Sinica, 43, 0312008(2023).

    [11] Chen R, Zhong W, Yang H Y et al. Faster region-based hotspot detection[J]. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 41, 669-680(2022).

    [12] Zhu X K, Lyu S C, Wang X et al. TPH-YOLOv5: improved YOLOv5 based on transformer prediction head for object detection on drone-captured scenarios[C], 2778-2788(2021).

    [13] Wang J N, Lü S T, Niu J. UAV detection method based on improved YOLOv5[J]. Optics & Optoelectronic Technology, 20, 48-56(2022).

    [14] Shu Z T, Zhang Z B, Song Y Z et al. Low-light image object detection based on improved YOLOv5 algorithm[J]. Laser & Optoelectronics Progress, 60, 0404001(2023).

    [15] Zheng Z H, Wang P, Ren D W et al. Enhancing geometric factors in model learning and inference for object detection and instance segmentation[J]. IEEE Transactions on Cybernetics, 52, 8574-8586(2022).

    [16] Hou Q B, Zhou D Q, Feng J S. Coordinate attention for efficient mobile network design[C], 13708-13717(2021).

    [17] Elfwing S, Uchibe E, Doya K. Sigmoid-weighted linear units for neural network function approximation in reinforcement learning[J]. Neural Networks, 107, 3-11(2018).

    [18] Gevorgyan Z. SIoU loss: more powerful learning for bounding box regression[EB/OL]. https://arxiv.org/abs/2205.12740

    [19] Torres J A. ICCAD-2012 CAD contest in fuzzy pattern matching for physical verification and benchmark suite[C], 349-350(2012).

    [20] Zhou K B, Zhang K F, Liu J E et al. An imbalance aware lithography hotspot detection method based on HDAM and pre-trained GoogLeNet[J]. Measurement Science and Technology, 32, 125008(2021).

    [21] Guo Q S, Shi Z, Zhang P Y. Lithographic hotspot detection based on faster R-CNN[J]. Microelectronics, 48, 834-838(2018).

    Qingyue Wu, Jiamin Liu, Song Zhang, Hao Jiang, Shiyuan Liu. Lithography Hotspot Detection Based on Improved Yolov5s[J]. Laser & Optoelectronics Progress, 2023, 60(24): 2422001
    Download Citation