Low-Temperature-Dependent Characteristics of Raman Scattering in N-Type 4H-SiC

MIAO Rui-xia; ZHAO Ping; LIU Wei-hong; TANG Xiao-yan

doi:10.3964/j.issn.1000-0593(2014)01-0108-03

Journals >Spectroscopy and Spectral Analysis >Volume 34 >Issue 1 >Page 108 > Article

Spectroscopy and Spectral Analysis
Vol. 34, Issue 1, 108 (2014)

Low-Temperature-Dependent Characteristics of Raman Scattering in N-Type 4H-SiC

MIAO Rui-xia^1、*, ZHAO Ping¹, LIU Wei-hong¹, and TANG Xiao-yan²

Author Affiliations

¹[in Chinese]

²[in Chinese]

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DOI: 10.3964/j.issn.1000-0593(2014)01-0108-03 Cite this Article

MIAO Rui-xia, ZHAO Ping, LIU Wei-hong, TANG Xiao-yan. Low-Temperature-Dependent Characteristics of Raman Scattering in N-Type 4H-SiC[J]. Spectroscopy and Spectral Analysis, 2014, 34(1): 108 Copy Citation Text

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References

[1] Elasser A. Pchow T. Prec. IEEE, 2002, 90: 969.

[2] Waldrop J R, Grant R W, Wang Y C. Journal of Applied Physics, 1992, 72: 4757.

[4] Chen Fengping, Zhang Yuming, Zhang Yimen. Chin. Phys. B, 2012, 21(3): 037304.

[5] Hyungtak K, Jpmgtae L, Ho-Young C. Journal of the Korean Physical Society, 2010, 56, 1523.

[6] Ivanov P A, Potapov A S, Samsonova T P. Semiconductor, 2012, 46: 532.

[7] Yang Yintang, Han Ru, Wang Ping. Chinese Physics B, 2008, 17(9): 3459-05.

[11] Yan F W, Gao H Y, Zhang H X. Journal of Applied Physics, 2007, 101: 023506.

MIAO Rui-xia, ZHAO Ping, LIU Wei-hong, TANG Xiao-yan. Low-Temperature-Dependent Characteristics of Raman Scattering in N-Type 4H-SiC[J]. Spectroscopy and Spectral Analysis, 2014, 34(1): 108

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