• Opto-Electronic Engineering
  • Vol. 34, Issue 8, 53 (2007)
[in Chinese]1、2, [in Chinese]1、2, [in Chinese]1、2, and [in Chinese]3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Selection of subset size of sub-pixel displacement registration algorithm in digital speckle correlation measurement[J]. Opto-Electronic Engineering, 2007, 34(8): 53 Copy Citation Text show less
    References

    [5] Zhou P,Goodson Kenneth E.Subpixel displacement and deformation gradient measurement using digital image/speckle correlation[J].Opt.Eng,2001,40(8):1613-1620.

    [6] Barron J L,Fleet D J.Systems and experiment performance of optical flow techniques[J].International Journal of Computer Vision,1994,12(1):43-77.

    [7] Zhang J,Jin G C.Application of an improved subpixel registration algorithm on digital speckle correlation measurement[J].Optics & Laser Technology,2003,35:533-542.

    [10] Vendroux G.,Knauss W.G.Submicron deformation field measurements:Parts 2.Improved digital image correlation[J].Exp.Mech,1998,38:86-92.

    [11] Schreier H W,Braasch J R,Sutton M A.Systemic errors in digital image correlation caused by intensity interpolation[J].Opt.Eng,2000,39(11):2915-2929.

    CLP Journals

    [1] Chen Tao, Liu Jianhua, Zhang Tan. Error Analysis of the Bending Tube Residual Stress Measurement System Based on Digital Speckle Correlation Method[J]. Laser & Optoelectronics Progress, 2011, 48(11): 111201

    [2] ZHU Meng, LONG Ningbo, ZHANG Hao, HUANG Zhanhua. Eddy Current Sensor Output Curves Calibration by Speckle Correlation[J]. Opto-Electronic Engineering, 2013, 40(10): 17

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Selection of subset size of sub-pixel displacement registration algorithm in digital speckle correlation measurement[J]. Opto-Electronic Engineering, 2007, 34(8): 53
    Download Citation