• Laser & Optoelectronics Progress
  • Vol. 62, Issue 11, 1127007 (2025)
Jiayi Chen1, Xin Jia1, Zhongxiao Xu1,2, and Heng Shen1,2,*
Author Affiliations
  • 1State Key Laboratory of Quantum Optics Technologies and Devices, Institute of Opto-Electronics, Shanxi University, Taiyuan 030006, Shanxi , China
  • 2Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, Shanxi , China
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    DOI: 10.3788/LOP250846 Cite this Article Set citation alerts
    Jiayi Chen, Xin Jia, Zhongxiao Xu, Heng Shen. Atomic Entanglement-Enhanced Quantum Metrology (Invited)[J]. Laser & Optoelectronics Progress, 2025, 62(11): 1127007 Copy Citation Text show less

    Abstract

    Quantum precision measurement refers to the utilization of quantum resources to achieve high-precision physical quantity measurements that surpass classical limits. Among these technologies, high-precision quantum sensors such as atomic clocks and atomic magnetometers, which are implemented through the manipulation of atomic spin states, can detect minute frequency or magnetic-field variations. Spin-squeezed states have garnered significant attention as a crucial quantum resource owing to their application in enhancing measurement sensitivity. This study systematically introduces three preparation methods for spin-squeezed states based on distinct physical mechanisms, reviews important research advancements in entanglement-enhanced quantum metrology, and presents prospects for future directions in entanglement-enhanced measurement technologies based on the rapidly developing field of programmable quantum many-body systems in recent years.