• Infrared and Laser Engineering
  • Vol. 35, Issue 3, 262 (2006)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Infrared detection tester for electronic circuit fault[J]. Infrared and Laser Engineering, 2006, 35(3): 262 Copy Citation Text show less
    References

    [1] PEARSON K V.Printed circuit board fault detection and isolation using thermal imaging techniques[C]//Proceedings of SPIE,1986,636:122-125.

    [2] HUGO P W.The infrared automatic mass screening(IRAMS)system for printed circuit board fault detection[C]//Proceedings of SPIE,1987,780:118-123.

    [3] WILLIAMS V H,FIKE D K.Failure analysis of raw printed citcuit boards using infrared thermography[C]//Proceedings of SPIE,1987,780:139-147.

    [4] ALLRED L G,KELLY G E.A system for fault diagnosis in electronic circuits using thermal imaging[C]//AUTOTESTCON '92.IEEE Systems Readiness Technology Conference,Conference Record,1992:455 -458.

    [5] ALLRED L G,KELLY G E.A modified genetic algorithm for extracting thermal profiles from infrared image data[C]//Proceedings of SPIE,Neural and Stochastic Methods in Image and Signal Processing,1992,1766:77 -81.

    [6] ALLRED L G,KELLY G E.A lossless image compression technique for infrared thermal images[C]//Proceedings of SPIE,Hybrid Hybrid Image and Signal Processing Ⅲ,1992,1702:230-237.

    [7] ALLRED L G,HOWARD T R.Application of thermal imaging to electronic fault diagnosis[C]//Proceedings of SPIE,Thermosense ⅩⅥ:An International Conference on Thermal Sensing and Imaging Diagnostic Applications,1994,2245:224-230.

    [8] ALLRED L G,HOWARD T R.Thermal imaging is the sole basis for repairing circuit cards in the F-16 flight control panel[C]//AUTOTESTCON' 96,Test Technology and Commercialization Conference Record,1996:418-424.

    [9] ALLRED L G.Guidelines for successful implementation of infrared thermography for repairing electronic circuit cards[C]//AUTOTESTCON' 96,'Test Technology and Commercialization'.Conference Record,1996:410-417.

    [10] ALLRED L G,HOWARD T R,SERPEN G.On -the -fly neural network construction for repairing F-16 flight control panel using thermal imaging[C]//Proceedings of SPIE,Thermosense ⅩⅧ:An International Conference on Thermal Sensing and Imaging Diagnostic Applications,1996,2766:284-294.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Infrared detection tester for electronic circuit fault[J]. Infrared and Laser Engineering, 2006, 35(3): 262
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