A New Method for Improving Measuring Accuracy of Fourier Transform Profilometry

[in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 29 >Issue 1 >Page 19 > Article

Opto-Electronic Engineering
Vol. 29, Issue 1, 19 (2002)

A New Method for Improving Measuring Accuracy of Fourier Transform Profilometry

[in Chinese] and [in Chinese]

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[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese]. A New Method for Improving Measuring Accuracy of Fourier Transform Profilometry[J]. Opto-Electronic Engineering, 2002, 29(1): 19 Copy Citation Text

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References

[1] Takeda M,Motoh K.Fourier transform profilometry for the automatic measurement of 3-D object shapes[J].Appl.Opt,l983,22 (24):3977-3982.

[2] Lin Jian-Feng,Su Xian-Yu.Two-dimensional Fourier transform profilometry for the automatic measurement of three-dimensional object shapes[J].Opt.Eng,1995,34(12):3297-3301 .

[3] Su Xian-Yu ,Li Jian ,Guo Lü-Rong .Improved Fourier transform profilometry[J].SPIE ,1988,954:32-35.

[4] Li Jian,Su Xian-Yu,Guo Lü-Rong.Improved Fourier transform profilometry of the automatic measurement of three-dimensional object shapes[J].Opt.Eng,1990,29(12):1439-1444 .

[6] Chen Wenjing,Hu Yang,Su Xianyu,et al.Eorror caused by sampling in Fourier transform profilometry[J].Opt.Eng,1999,38(6):1029-1033.

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[in Chinese], [in Chinese]. A New Method for Improving Measuring Accuracy of Fourier Transform Profilometry[J]. Opto-Electronic Engineering, 2002, 29(1): 19

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