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    Journals >Opto-Electronic Engineering >Volume 29 >Issue 1 >Page 19 > Article
    • Opto-Electronic Engineering
    • Vol. 29, Issue 1, 19 (2002)
    A New Method for Improving Measuring Accuracy of Fourier Transform Profilometry
    [in Chinese] and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. A New Method for Improving Measuring Accuracy of Fourier Transform Profilometry[J]. Opto-Electronic Engineering, 2002, 29(1): 19 Copy Citation Text show less

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    [in Chinese], [in Chinese]. A New Method for Improving Measuring Accuracy of Fourier Transform Profilometry[J]. Opto-Electronic Engineering, 2002, 29(1): 19
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