• Laser & Optoelectronics Progress
  • Vol. 57, Issue 3, 033001 (2020)
Zhiqiang Ning1、2, Jiaxiang Liu2, Yue Wu2, Mengqi Tao2, and Yonghua Fang1、2、*
Author Affiliations
  • 1School of Environment Science and Optoelectronic Technology, University of Science and Technology of China, Hefei, Anhui 230026, China
  • 2Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China
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    DOI: 10.3788/LOP57.033001 Cite this Article Set citation alerts
    Zhiqiang Ning, Jiaxiang Liu, Yue Wu, Mengqi Tao, Yonghua Fang. Infrared Spectrum Baseline Correction Method Based on Improved Iterative Polynomial Fitting[J]. Laser & Optoelectronics Progress, 2020, 57(3): 033001 Copy Citation Text show less

    Abstract

    The baseline of an infrared spectrum will drift when a Fourier transform infrared spectrometer is used to detect pollution gases. An infrared spectral baseline correction method based on improved iterative polynomial fitting is proposed in this paper. The method automatically identifies characteristic spectral peaks and subsequently cuts off the characteristic peaks from the spectrum. Then, it uses the bilateral threshold to iteratively fit the infrared spectrum to obtain the best-fitting baseline. The proposed method was verified using the simulated and measured spectra of trichloroethane and ammonia, and the results were compared with those obtained by the three common polynomial fitting methods. The results show that the characteristic peaks of the corrected spectra are more obvious and the baseline is more gradual after baseline correction using proposed method. The simulation and measured data show that our baseline correction method improves the accuracy of the existing polynomial fitting baseline correction method and exhibits good performance.
    Zhiqiang Ning, Jiaxiang Liu, Yue Wu, Mengqi Tao, Yonghua Fang. Infrared Spectrum Baseline Correction Method Based on Improved Iterative Polynomial Fitting[J]. Laser & Optoelectronics Progress, 2020, 57(3): 033001
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