De-Wen Yang, Chang-Hua Chen, Yan-Chao Shi, Ren-Zhen Xiao, Yan Teng, Zhi-Qiang Fan, Wen-Yuan Liu, Zhi-Min Song, Jun Sun. Investigation of an X band high efficiency klystron-like relativistic backward wave oscillator [J]. Acta Physica Sinica, 2020, 69(16): 164102-1
- Acta Physica Sinica
- Vol. 69, Issue 16, 164102-1 (2020)
Fig. 1. Schematic of a high efficiency klystron-like RBWO. (1 pre-modulation cavity; 2 modulation ridge; 3 slow wave structure; 4 extraction cavity; 5 electron beam collector; 6 resonant reflector; 7 electron beam; 8 guiding magnet; 9 cathode)
Fig. 2. Pre-modulation structure with two cavities.
Fig. 3. Effect of the two modulation cavity spacing L 1 on efficiency.
Fig. 4. Schematic of enhanced extraction cavity: (a) Rectangular extraction cavity; (b) perfect extraction cavity.
Fig. 5. Schematic of two extraction cavities: (a) Rectangular extraction cavity; (b) ellipse extraction cavity.
Fig. 6. Field distribution in rectangular extraction cavity in PIC simulation: (a) Ez orients – z direction; (b) Ez orients +z direction.
Fig. 7. Longitudinal electric field distribution in ellipse extraction cavity in PIC simulation: (a) E z orients – z direction; (b) E z orients +z direction.
Fig. 8. Magnetic field of superconductor magnet.
Fig. 9. Phasespace of electron beam under solenoid and superconductor magnet: (a) Case with solenoid magnet; (b) case with superconductor magnet.
Fig. 10. Variation of efficiency with L ec under solenoid and superconductor magnet.
Fig. 11. Typical results in PIC simulation: (a) Microwave power; (b) frequency spectrum.
Fig. 12. Effect of diode voltage under different L ak: (a) Variation of efficiency with diode voltage; (b) variation of frequency with diode voltage.
Fig. 13. Schematic of experiment system.
Fig. 14. Picture of the Klystron-like RBWO.
Fig. 15. Schematic of measurement system.
Fig. 16. Calibration result of envelope detector.
Fig. 17. Surface with different roughness: (a) Roughness Ra = 0.4; (b) roughness Ra = 0.05.
Fig. 18. Output waveform for different roughness: (a) Roughness Ra = 0.4; (b) Roughness Ra = 0.05. (channel 1, online microwave; channel 2 and 3, radiation field)
Fig. 19. Breakdown traces after 120 pulses for different roughness: (a) Roughness Ra = 0.4; (b) roughness Ra = 0.05.
Fig. 20. Lifetime of extraction cavity: (a) After 100 pulses; (b) after 130 pulses. (channel 1, online microwave; channel 2 and 3, radiation field)
Fig. 21. Waveform under rectangular and ellipse extraction cavity: (a) Rectangular extraction cavity; (b) ellipse extraction cavity. (channel 1, diode voltage; channel 2, diode current; channel 3, radiation field)
Fig. 22. Breakdown trace after 40 pulses: (a) Rectangular extraction cavity; (b) ellipse extraction cavity.
Fig. 23. Power density distribution of radiation field.
Fig. 24. Microwave waveform and frequency spectrum.
|
Table 1.
Parameters of rectangular extraction cavity.
矩形提取腔各参数
|
Table 2.
Parameters of ellipse extraction cavity.
椭圆形提取腔各参数
|
Table 3.
Calibration result of measurement element.
测量元件的衰减标定值
Set citation alerts for the article
Please enter your email address
© Copyright 2018-2021 | Chinese Laser Press. All Rights Reserved 沪ICP备15018463号-20