• Acta Optica Sinica
  • Vol. 37, Issue 7, 722003 (2017)
Wang Wei1、2, Bayanheshig1, Pan Mingzhong1, Song Ying1, and Li Wenhao1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/aos201737.0722003 Cite this Article Set citation alerts
    Wang Wei, Bayanheshig, Pan Mingzhong, Song Ying, Li Wenhao. Beam Alignment Error and Its Control in Scanning Beam Interference Lithography System[J]. Acta Optica Sinica, 2017, 37(7): 722003 Copy Citation Text show less
    References

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    [2] Montoya J. Toward nano-accuracy in scanning beam interference lithography[D]. Boston: Massachusetts Institute of Technology, 2006.

    [3] Chen C G. Beam alignment and image metrology for scanning beam interference lithography: fabricating gratings with nanometer phase accuracy[D]. Boston: Massachusetts Institute of Technology, 2003.

    [4] Jiang Shan, Bayanheshig, Song Ying, et al. Effect of measured interference fringe period error on groove profile of grating masks in scanning beam interference lithography system[J]. Acta Optica Sinica, 2014, 34(4): 0405003.

    [5] Song Ying, Bayanheshig, Qi Xiangdong, et al. Design of frequency-shift interference fringe locking system in holographic grating exposure[J]. Optics and Precision Engineering, 2014, 22(2): 318-324.

    [6] Jiang Shan, Bayanheshig, Li Wenhao, et al. Effect of period setting value on printed phase in scanning beam interference lithography system[J]. Acta Optica Sinica, 2014, 34(9): 0905003.

    [7] Han Jian. The research on the lithography system optimization and the grating mask profile parameters controlling in the fabrication of the holographic grating[D]. Beijing: Graduate University of Chinese Academy of Sciences, 2012.

    [8] Li Xiaotian, Qi Xiangdong, Yu Haili, et al. Yaw angel correction of grating line based on single piezoelectric actuator[J]. Optics and Precision Engineering, 2014, 22(8): 2039-2046.

    [9] Yang Chao, Yu Haili, Feng Shulong, et al. Influence of running accuracy of ruling carriage system on grating spectrum performance[J]. Optics and Precision Engineering, 2014, 22(10): 2674-2682.

    [10] Konkola P T, Chen C G, Heilmann R K, et al. Beam steering system and spatial filtering applied to interference lithography[J]. Journal of Vacuum Science and Technology B, 2000, 18(6): 3282-3286.

    [11] Bao Jianfei, Huang Lihua, Zeng Aijun, et al. Study on beam stabilization technique in lithography illumination system[J]. Chinese J Lasers, 2012, 39(9): 0908004.

    [12] Li Yao, Wang Ding, Guo Xiaoyang, et al. Fast and accurate laser beam automatic alignment system based on COMS sensor[J]. Chinese J Lasers, 2013, 40(9): 0916002.

    [13] Li Hong, Wang Dongfang, Zou Wei, et al. Design of high power laser beam automatic alignment system[J]. Chinese J Lasers, 2013, 40(10): 1002003.

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    [16] Zhao Jinsong, Li Lifeng, Wu Zhenhua. Modeling of in-situ monitoring curves during development of holographic gratings[J]. Acta Optica Sinica, 2004, 24(8): 1146-1150.

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    Wang Wei, Bayanheshig, Pan Mingzhong, Song Ying, Li Wenhao. Beam Alignment Error and Its Control in Scanning Beam Interference Lithography System[J]. Acta Optica Sinica, 2017, 37(7): 722003
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