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    Journals >Opto-Electronic Engineering >Volume 33 >Issue 11 >Page 137 > Article
    • Opto-Electronic Engineering
    • Vol. 33, Issue 11, 137 (2006)
    Beam hardening fitting correction method for X-ray TICT
    [in Chinese]1、2, [in Chinese]3, [in Chinese]3, [in Chinese]4, [in Chinese]1, and [in Chinese]1
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Beam hardening fitting correction method for X-ray TICT[J]. Opto-Electronic Engineering, 2006, 33(11): 137 Copy Citation Text show less
    References

    [1] Barbara R.Krohn,Michael D.Silver.Optimizing Contrast Resolution in Industrual Computed Tomographic Scanners[J].Materials Evaluation,1990,49(10):1296-1331.

    [2] Rogerio Ferreira de Paiva,John Lynch,Elisabeth Rosenberg,et al.A beam hardening correction for X-ray microtomography[J].NDT&Interuational,1998,31(1):17-22.

    [3] R.Hanke,F.Bobel.Determination of material flaw size by intensity evaluation of polychromatic X-ray transmission[J].NDT&E International,1992,25(2):87-93.

    [5] M.J.Guy,l.A.Castellano-Smith,M.A.Flower,et al.DETECT-Dual Engergy Transmission Estimation CT-for improved attenuation correction in SPECT and PET[J].IEEE Transaction on Nuclear Science,1998,45(3):1261-1265.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Beam hardening fitting correction method for X-ray TICT[J]. Opto-Electronic Engineering, 2006, 33(11): 137
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