Design and Experimental Study of Sinusoidal Structured Light Mask with “S” Shaped Binary Coding

Pei Zhou; Jiangping Zhu; Hailong Jing; Zhijuan Duan; Shiyong An; Yanqiong Guo

doi:10.3788/LOP57.151203

[1] Geng J. Structured-light 3D surface imaging: a tutorial[J]. Advances in Optics and Photonics, 3, 128-160(2011).

[2] Liu Y K, Su X Y, Zhang Q C. A novel encoded-phase technique for phase measuring profilometry[J]. Optics Express, 19, 14137-14144(2011).

[3] Schmalz C, Forster F, Schick A et al. An endoscopic 3D scanner based on structured light[J]. Medical Image Analysis, 16, 1063-1072(2012).

[4] Yang P B, Deng L J, Chen Y et al. Three-dimensional shape measurement of highly reflective objects based on structured light[J]. Chinese Journal of Lasers, 46, 0204004(2019).

[5] Ge Q J, Shi J L, Sun Y H. Structured light three-dimensional scene reconstruction based on binary space coding and decoding[J]. Laser & Optoelectronics Progress, 57, 021509(2020).

[6] Lu M T, Su X Y. Vertical measurement method for structured light three-dimensional profilometry based on phase-shifting and modulation ratio[J]. Chinese Journal of Lasers, 46, 0704003(2019).

[7] Dou Y F, Su X Y. A flexible 3D profilometry based on fringe contrast analysis[J]. Optics & Laser Technology, 44, 844-849(2012).

[8] Huang Y, Zhong J G. Improved algorithm to choose the window scale for windowed Fourier transform profilometry[J]. Optical Technique, 36, 378-385(2010).

[9] Zhang Z H, Jing Z, Wang Z H et al. Comparison of Fourier transform, windowed Fourier transform, and wavelet transform methods for phase calculation at discontinuities in fringe projection profilometry[J]. Optics and Lasers in Engineering, 50, 1152-1160(2012).

[10] Zhong M, Chen W J, Su X Y et al. Optical 3D shape measurement profilometry based on 2D S-transform filtering method[J]. Optics Communications, 300, 129-136(2013).

[11] Chen W J, Shen Q J, Zhong M. Comparison of 2D S-transform profilometry and 2D windowed Fourier transform profilometry[J]. Optik, 124, 6732-6736(2013).

[12] Wang T, Chen W J, Zhong M et al. 2D S-transform profilometry based on the structured light projection[J]. Acta Optica Sinica, 32, 1207002(2012).

[13] Lü B T. Three-dimensional measurement of specular surfaces using phase measuring deflectometry[J]. Laser & Optoelectronics Progress, 56, 031201(2019).

[14] Zhao W C, Su X Y, Liu Y K et al. Testing an aspheric mirror based on phase measuring deflectometry[J]. Chinese Journal of Lasers, 37, 1338-1341(2010).

[15] Takeda M, Mutoh K. Fourier transform profilometry for the automatic measurement of 3-D object shapes[J]. Applied Optics, 22, 3977-3982(1983).

[16] Wu F, Zhang H, Lalor M J et al. A novel design for fiber optic interferometric fringe projection phase-shifting 3-D profilometry[J]. Optics Communications, 187, 347-357(2001).

[17] Yokota M, Asaka A, Yoshino T. Stabilization improvements of laser-diode closed-loop heterodyne phase-shifting interferometer for surface profile measurement[J]. Applied Optics, 42, 1805-1808(2003).

[18] Su W H, Liu H Y, Richard K et al. Fabrication of digital sinusoidal gratings and precisely controlled diffusive flats and their application to highly accurate projected fringe profilometry[J]. Optical Engineering, 42, 1730-1740(2003).

[19] Zheng D L, Da F P. Gamma correction method for accuracy enhancement in grating projection profilometry[J]. Acta Optica Sinica, 31, 0512003(2011).

[20] Huang P S, Zhang C P, Chiang F. High-speed 3-D shape measurement based on digital fringe projection[J]. Optical Engineering, 42, 163-168(2003).

[21] Guo H W, He H T, Chen M Y. Gamma correction for digital fringe projection profilometry[J]. Applied Optics, 43, 2906-2914(2004).

[22] Xiao C, Chen F, Zhong M. Method for improving measurement accuracy of inverse fringe[J]. Laser & Optoelectronics Progress, 53, 111204(2016).

[23] Zhang S, Yau S T. Generic nonsinusoidal phase error correction for three-dimensional shape measurement using a digital video projector[J]. Applied Optics, 46, 36-43(2007).

[24] Tian Z X, Chen W J, Su X Y. Method for improving accuracy and measurement speed of PMP using error diffusion binary encoded sinusoidal grating[J]. Laser & Optoelectronics Progress, 51, 121201(2014).

[25] Cheng J, Su X Y. Study on error diffusion algorithm of binary encode grating[J]. Laser Technology, 31, 322-325, 332(2007).

[26] Bell T, Zhang S. Toward superfast three-dimensional optical metrology with digital micromirror device platforms[J]. Optical Engineering, 53, 112206(2014).

[27] Wang Y J, Zhang S. Comparison of the squared binary, sinusoidal pulse width modulation, and optimal pulse width modulation methods for three-dimensional shape measurement with projector defocusing[J]. Applied Optics, 51, 861-872(2012).

[28] Wang Y J, Zhang S. Three-dimensional shape measurement with binary dithered patterns[J]. Applied Optics, 51, 6631-6636(2012).

[29] Su X Y, Li J T[M]. Information optics(2011).

[30] Zhong M, Su X Y, Chen W J et al. Modulation measuring profilometry with auto-synchronous phase shifting and vertical scanning[J]. Optics Express, 22, 31620-31634(2014).

[31] Zhu J P, Zhou P, Su X Y et al. Accurate and fast 3D surface measurement with temporal-spatial binary encoding structured illumination[J]. Optics Express, 24, 28549-28560(2016).